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39th Meeting: Daejeon, KR, June 2025 2025-06-25 04:24
EE2-4.2: Reuse of ALF control information
Authors: Nan Hu Qualcomm H. Wang Qualcomm Marta Karczewicz Qualcomm Vadim Seregin Qualcomm
Abstract
In ECM-17.0, for each picture, ALF control information is signalled at both picture and CTB levels. In this EE test, CTB-level information for chroma ALF and CCALF can be used by future pictures. On top of ECM-17.0 following common test conditions, simulation results of the proposed method are reported below:
Meeting Notes
JVET-AM0209 EE2-4.2: Reuse of ALF control information [N. Hu, H. Wang, M. Karczewicz, V. Seregin (Qualcomm)]
Cited:
JVET-AM0306 X
ARCHIVE :
JVET-AM0209-v1.docx JVET-AM0209-v2.docx JVET-AM0209.xlsm
Decisions
JVET-AM0209 EE2-4.2: Reuse of ALF control information [N. Hu, H. Wang, M. Karczewicz, V. Seregin (Qualcomm)]
Citation