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12th Meeting: Macao, October 2018 2018-10-03 13:00
CE11.1.11: Combination of CE11.1.1 and CE11.1.7
Abstract
The contribution reports the results of test CE11.1.11. The test is a combination of technologies proposed in CE11.1.1 and CE11.1.7. It is asserted that the proposed design reduces the blocking artifacts resulting from the use of large coding units and large transforms. The process incorporates stronger filters for both luma and chroma. Additionally, the process includes a control process that considers the block sizes on both sides of the boundary being deblocked. In the proposal, the stronger filters are used for luma samples when either side of the deblocking boundary belong to a large block. For chroma, the stronger filter is applied when chroma samples on both sides of the deblocking boundary belong to a large block and the HEVC luma strong filter conditions are satisfied. It is asserted that the proposed deblocking approach improves subjective quality at low bit-rates when compared with the deblocking process existing in the VTM software. The BD-Rate number for Y, U & V reportedly shows 0.02%, -0.43% & -0.41% at AI, 0.25%, -0.37% & -0.35% at RA, 0.43%, -0.18% & -0.11% at LDB and 0.30%, 0.05% & 0.00 % at LDP over VTM-2.0.1 with ALF switched on, respectively. When ALF is switched off, the BD-Rate results for Y, U & V reportedly shows -0.01, -0.56% & -0.50% at AI, 0.17%, -0.45% &-0.38% at RA, 0.45%, -0.08% &-0.09% at LDB, and -0.17%, 0.02%& -0.08% at LDP, respectively.
JVET-L0337 CE11.1.11: Combination of CE11.1.1 and CE11.1.7 [W. Zhu, K. Misra, P. Cowan, A. Segall (Sharp), K. Andersson, Z. Zhang, R. Sjöberg (Ericsson)]
PATENTS:
JP7443302B2 0.34 2024-03-05 US12184700B2 0.32 2024-12-31 US11550351B2 0.30 2023-01-10 JP7657338B2 0.28 2025-04-04 US11530267B2 0.26 2022-12-20 JP7685867B2 0.24 2025-05-30 US20240288550A1 0.22 2024-08-29 US12358049B2 0.20 2025-07-15
Decisions
JVET-L0337 CE11.1.11: Combination of CE11.1.1 and CE11.1.7 [W. Zhu, K. Misra, P. Cowan, A. Segall (Sharp), K. Andersson, Z. Zhang, R. Sjöberg (Ericsson)]
Citation