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39th Meeting: Daejeon, KR, June 2025 2025-07-01 05:02
EE2-4.4: On In-Loop filtering in ECM
Authors: Dmytro Rusanovskyy Nokia Sujun Hong Nokia K. Panusopone Nokia Liqiang Wang Nokia Jani Lainema Nokia Nan Hu Qualcomm Marta Karczewicz Qualcomm Muhammed Coban Qualcomm H. Wang Qualcomm Y. Shao Qualcomm Jiayi Wang Qualcomm Yun Li Qualcomm Vadim Seregin Qualcomm
Abstract
This contribution reports the test results of EE2-4.4, where encoder and decoder complexity constrained integration of NN-ILF into ECM (JVET-AL0225) is being tested. The method was tested with NN-ILF interface 1, and VLOP3 and VLOP architecture of EE1-2.1, defined in this document as Tests A and B, respectively. Performance of the proposed method over the ECM17 is reported below:
Meeting Notes
JVET-AM0219 EE2-4.4: On In-Loop filtering in ECM [D. Rusanovskyy, S. Hong, K. Panusopone, L. Wang, J. Lainema (Nokia), N. Hu, M. Karczewicz, M. Coban, H. Wang, Y. Shao, J. Wang, Y. Li, V. Seregin (Qualcomm)]
JVET-AM0241 crosscheck of JVET-AM0219 (EE2-4.4) [T. Poirier, F. Galpin (InterDigital)] [late]
Cited:
JVET-AM0241 X
ARCHIVE :
JVET-AM0219-v6.docx JVET-AM0219_testA-v6_FIX.xlsm JVET-AM0219_testA.xlsm JVET-AM0219_testB-v6.xlsm
Decisions
JVET-AM0219 EE2-4.4: On In-Loop filtering in ECM [D. Rusanovskyy, S. Hong, K. Panusopone, L. Wang, J. Lainema (Nokia), N. Hu, M. Karczewicz, M. Coban, H. Wang, Y. Shao, J. Wang, Y. Li, V. Seregin (Qualcomm)]
Citation