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39th Meeting: Daejeon, KR, June 2025 2025-06-18 23:46
EE2-2.3: Affine bilateral matching mode
Authors: Han Huang Qualcomm Vadim Seregin Qualcomm Marta Karczewicz Qualcomm
Abstract
This contribution reports test result of EE2 Test 2.3 on affine bilateral matching mode. It is reported that {-0.03%(Y), -0.02(U)%, -0.02%(V)} BD-rate change with 102.7% EncT and 98.9% DecT can be achieved under RA CTC
Meeting Notes
JVET-AM0088 EE2-2.3: Affine bilateral matching mode [H. Huang, V. Seregin, M. Karczewicz (Qualcomm)]
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JVET-AM0088.docx JVET-AM0088.xlsm
Decisions
JVET-AM0088 EE2-2.3: Affine bilateral matching mode [H. Huang, V. Seregin, M. Karczewicz (Qualcomm)]
Citation