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4th Meeting: Chengdu, October 2016 2016-10-18 02:34
EE8: Cross-check of decoder-side intra mode derivation
Authors: B. Jin Samsung Elena Alshina Samsung Chul Keun Kim Samsung

Abstract not available in document

Meeting Notes
JVET-D0059 EE8: Cross-check of decoder-side intra mode derivation [B. Jin, E. Alshina, C. Kim (Samsung)] [late]
ARCHIVE v2 :
EE8_T3_Result.xlsm EE8_T4_Result.xlsm JVET-D0059.doc
Decisions
JVET-D0059 EE8: Cross-check of decoder-side intra mode derivation [B. Jin, E. Alshina, C. Kim (Samsung)] [late]
Citation