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EE1-2.1: Super Resolution with existing VVC functionality
Abstract
This contribution reports the performance of RPR tool in VVC if tested for providing super-resolution functionality (test 2.1 in EE1). Experiments are limited to scaling factor 2.0 only. In average under AhG11 test conditions gains (in Y-PSNR) of 1.2 % in random access and 0.6% in all intra configuration can be achieved. Gain is higher in MS-SSIM metric (2.9% in random access and 1.9% in all intra configuration).
JVET-Y0061 EE1-2.1: Super Resolution with existing VVC functionality [E. Alshina, J. Sauer (Huawei]
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JVET-Y0061 EE1-2.1: Super Resolution with existing VVC functionality [E. Alshina, J. Sauer (Huawei]
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