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EE2-5.3: Updated multi-models usage strategy for ALF-CCCM
Abstract
This contribution reports the test results of EE2-5.3. The EE test proposes a method of applying multi-models to a block directly. Additionally, the bad window condition is separated for the Cb and Cr components, respectively. In test EE2-5.3a, the method of directly applying multi-models to a block is tested. In test EE2-5.3b, the scheme of treating the bad window condition separately for the Cb and Cr components is tested. In test EE2-5.3c, the combination of EE2-5.3a and EE2-5.3b is tested. On top of ECM-18.0 with the common test conditions, simulation results of the proposed methods are reported as follows:
JVET-AN0101 EE2-5.3: Updated multi-models usage strategy for ALF-CCCM [N. Song, L. Xu, Z. Xie, Y. Yu, H. Yu, D. Wang (OPPO)]
JVET-AN0101 Test 5.3a.
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JVET-AN0101 EE2-5.3: Updated multi-models usage strategy for ALF-CCCM [N. Song, L. Xu, Z. Xie, Y. Yu, H. Yu, D. Wang (OPPO)]
JVET-AN0101 Test 5.3a.
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