JVET-AL0282 AHG13: Film grain analysis improvement [M. Radosavljević, F. Lefebvre, Z. Ameur, P. de Lagrange (InterDigital)] [late]
This work presents several enhancements to the film grain analysis process. The proposed enhancements, primarily software updates, represent a natural progression aimed at improving the functionality of the software. They include:
- Improved cut-off frequency estimation where cut-off frequencies are now estimated per intensity interval.
- Improved scaling factor estimation by aggregating over the time data points used to fit the curve.
- Not performing analysis of chroma film grain when there is no grain in luma.
- Fixing the bug in cut-off frequency estimation.
- Fixing the bug (at one place only) that considered only 10bit input when processing data points in scaling function estimation.
Experiments were carried out on different film grain sequences, and the visual evaluation demonstrated that the estimated film grain parameters result in a higher fidelity representation of the film grain compared to the source.
Different cutoff frequencies can be used per intensity interval, and a 16x16 block grid is used for estimation. Both are functionalities supported by the SEI message, but not in current analysis software yet.
Scaling factor is stabilized to have less variation over different frames.
Decision(SW): Adopt JVET-AL0282 to film grain part of VTM
Decision: Also include in the TR new version JVET-AL2020