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30th Meeting: Antalya, TR, April 2023 2023-04-15 00:02
EE2-4.2/4.3/4.4a: Residual based classifier and modified filter shape for ALF
Authors: Ikram Jumakulyyev Qualcomm Nan Hu Qualcomm Zixiang Zhang Qualcomm Vadim Seregin Qualcomm Marta Karczewicz Qualcomm Han Huang Qualcomm
Abstract
This contribution reports results of EE tests 4.2, 4.3 and 4.4a. In test 4.2, an additional residual-based classifier for ALF is tested. In test 4.3, a modified ALF filter shape with more filter coefficients used for fixed-filter outputs is tested. Finally, in test 4.4a, the combination of 4.2 and 4.3 is tested. On top of ECM-8.0, simulation results of the proposed methods are reported as follows.
Meeting Notes
JVET-AD0219 EE2-4.2/4.3/4.4a: Residual based classifier and modified filter shape for ALF [I. Jumakulyyev, N. Hu, Z. Zhang, V. Seregin, M. Karczewicz, H. Huang (Qualcomm)]
Cited:
JVET-AD0227 X
ARCHIVE :
JVET-AD0219-EE42-Classifier.xlsm JVET-AD0219-EE43-Shape.xlsm JVET-AD0219-EE44a-Classifier-Shape.xlsm JVET-AD0219-v1.docx
Decisions
JVET-AD0219 EE2-4.2/4.3/4.4a: Residual based classifier and modified filter shape for ALF [I. Jumakulyyev, N. Hu, Z. Zhang, V. Seregin, M. Karczewicz, H. Huang (Qualcomm)]
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