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30th Meeting: Antalya, TR, April 2023 2023-04-21 07:48
EE2-3.7: Combination tests of EE2-3.2+EE2-3.4b
Authors: N. Zhang ByteDance Kai Zhang ByteDance Li Zhang ByteDance Zixiang Zhang Qualcomm Pavel Nikitin Qualcomm Han Huang Qualcomm Vadim Seregin Qualcomm Marta Karczewicz Qualcomm
Abstract
This document reports results for EE2-3.7 on combination tests of EE2-3.2+EE2-3.4b.
Meeting Notes
JVET-AD0097 EE2-3.7: Combination tests of EE2-3.2+EE2-3.4b [N. Zhang, K. Zhang, L. Zhang (Bytedance), Z. Zhang, P. Nikitin, H. Huang, V. Seregin, M. Karczewicz (Qualcomm)]
Cited:
JVET-AD0354 X
ARCHIVE :
JVET-AD0097-3.7a.xlsm JVET-AD0097-3.7b.xlsm JVET-AD0097-additionalResults-cfg-A1.xlsm JVET-AD0097-additionalResults-cfg-A3.xlsm JVET-AD0097-additionalResults-cfg-B1.xlsm JVET-AD0097-additionalResults-cfg-B3.xlsm JVET-AD0097-v1.docx JVET-AD0097-v2.docx Test_3.7.patch
Decisions
JVET-AD0097 EE2-3.7: Combination tests of EE2-3.2+EE2-3.4b [N. Zhang, K. Zhang, L. Zhang (Bytedance), Z. Zhang, P. Nikitin, H. Huang, V. Seregin, M. Karczewicz (Qualcomm)]
Citation