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JVET-AP0007
42nd Meeting: Santa Eulària, ES, April 2026 2026-04-24 11:59
JVET AHG report: Tool assessment (AHG7)

X. Li (chair), L.-F. Chen, Z. Deng, J. Gan, E. François, R. Ishimoto, H.-J. Jhu, J. Lainema, X. Li, J. Pardo, A. Stein, H. Wang (vice chairs)

JVET-AP0179
42nd Meeting: Santa Eulària, ES, April 2026 2026-04-21 10:59
AHG9: Historical Information SEI message

J. Pardo, A. Karabutov, H. You, A. Boev, J. Sauer, T. Solovyev, E. Alshina (Huawei), X. Xu, S. Liu (Tencent)

JVET-AO0120
41st Meeting: by teleconference, CH, January 2026 2026-01-19 17:59
AHG9: Historical Information SEI message

J. Pardo, A. Karabutov, H. You, A. Boev, J. Sauer, T. Solovyev, E. Alshina (Huawei)

JVET-AO0007
41st Meeting: by teleconference, CH, January 2026 2026-01-13 18:02
JVET AHG report: Tool assessment (AHG7)

X. Li (chair), L.-F. Chen, Z. Deng, J. Gan, E. François, R. Ishimoto, H.-J. Jhu, J. Lainema, X. Li, J. Pardo, A. Stein, H. Wang (vice chairs)

JVET-AO0237
41st Meeting: by teleconference, CH, January 2026 2026-01-13 17:03
Crosscheck of JVET-AO0133 (EE1-3.3: Combination of EE1-3.1 and EE1-3.2)

J. Pardo (Huawei)

JVET-AO0236
41st Meeting: by teleconference, CH, January 2026 2026-01-13 17:03
Crosscheck of JVET-AO0117 (EE1-3.1: Normative TDO method as an alternative option in NNVC)

J. Pardo (Huawei)

JVET-AN0052
40th Meeting: Geneva, CH, October 2025 2025-10-06 22:35
[AHG17] [ Performance of GOP based RPR under CfE test conditions

Y. Sun, Y. Zhao, J. Sauer, J. Pardo, P. Jia, T. Solovyev, E. Alshina (Huawei)

JVET-AN0212
40th Meeting: Geneva, CH, October 2025 2025-10-06 22:22
AHG17: Description of NNVC-based CfE response

D. Kim, S.-C. Lim (ETRI), T. Solovyev, J. Sauer, J. Pardo, P. Jia, A. Karabutov, E. Alshina (Huawei), H. Kwon, H. Ko (HYU), F. Galpin, T. Dumas, E. François (InterDigital), Y. Li, M. Karczewicz (Qualcomm), Z. Xiang, R. Chernyak, S. Liu (Tencent)

JVET-AN0007
40th Meeting: Geneva, CH, October 2025 2025-10-03 13:59
JVET AHG report: ECM tool assessment (AHG7)

X. Li (chair), L.-F. Chen, Z. Deng, J. Gan, E. François, R. Ishimoto, H.-J. Jhu, J. Lainema, X. Li, J. Pardo, A. Stein, H. Wang (vice chairs)

JVET-AN0253
40th Meeting: Geneva, CH, October 2025 2025-09-26 22:06
AHG7: On Memory Bandwidth Measurement

X. Li (Google), Y. Kim (Samsung), J. Pardo (Huawei), R. Ishimoto (Sharp), L.-F. Chen (Tencent)

JVET-AM0007
39th Meeting: Daejeon, KR, June 2025 2025-06-26 03:24
JVET AHG report: ECM tool assessment (AHG7)

X. Li (chair), L.-F. Chen, Z. Deng, J. Gan, E. François, R. Ishimoto, H.-J. Jhu, J. Lainema, X. Li, J. Pardo, A. Stein, H. Wang (vice chairs)

JVET-AL0322
39th Meeting: Daejeon, KR, March 2025 2025-03-28 15:02
AhG17: CfE draft: Sequences selection illustration

J. Pardo (Huawei)

JVET-AL0304
39th Meeting: Daejeon, KR, March 2025 2025-03-27 18:44
Crosscheck of JVET-AL0245 ([AHG7][AHG17] Further consideration of common test condition)

J. Pardo

JVET-AL0007
39th Meeting: Daejeon, KR, March 2025 2025-03-25 23:49
JVET AHG report: ECM tool assessment (AHG7)

X. Li (chair), L.-F. Chen, Z. Deng, J. Gan, E. François, R. Ishimoto, H.-J. Jhu, J. Lainema, X. Li, J. Pardo, A. Stein, H. Wang (vice chairs)

JVET-AL0050
39th Meeting: Daejeon, KR, March 2025 2025-03-07 12:39
AHG17: UGC test sequences from Huawei

J. Pardo, Y. Zhao, Y. Sun, P. Liu, Y. Lu, C. Wang (Huawei)

JVET-AK0221
37th Meeting: Geneva, CH, January 2025 2025-01-19 12:31
[AHG17] JVET CTC and non-CTC sequences performance analysis

E. Alshina, J. Pardo, J. Sauer, T. Solovyev (Huawei)

JVET-AK0201
37th Meeting: Geneva, CH, January 2025 2025-01-19 12:02
On additional operation point for the exploration model

T. Solovyev, J. Pardo, J. Sauer, Z. Li, E. Alshina (Huawei)

JVET-AK0196
37th Meeting: Geneva, CH, January 2025 2025-01-18 11:27
AHG17: Additional sequences for testing of video coding technology beyond CTC

J. Pardo, Y. Sun, T. Solovyev, E. Alshina (Huawei)

JVET-AK0241
37th Meeting: Geneva, CH, January 2025 2025-01-17 06:47
Crosscheck of JVET-AK0093 (EE1-1.5: Adaptive skip of LOP filtering based on boundary strength partitions)

J. Pardo, E. Alshina (Huawei)

JVET-AK0007
37th Meeting: Geneva, CH, January 2025 2025-01-13 20:14
JVET AHG report: ECM tool assessment (AHG7)

X. Li (chair), L.-F. Chen, Z. Deng, J. Gan, E. François, R. Ishimoto, H.-J. Jhu, X. Li, J. Pardo, H. Wang (vice chairs)

JVET-AK0041
37th Meeting: Geneva, CH, January 2025 2024-11-21 10:18
AHG17: Materials for assisting sequence selection for Non-CTC testing

J. Pardo, J. Sauer (Huawei)

JVET-AI0052
35th Meeting: Sapporo, JP, July 2024 2024-07-12 07:55
AHG11: Add checksums of sequences to NNVC CTC

J. Pardo (Huawei)

JVET-AQ0179
43rd Meeting: Geneva, July 2026
AHG9: Processing History Information SEI

C. Feldmann, T. Biatek, J. Boyce (Nokia), J. Pardo, T. Solovyev, E. Alshina (Huawei), X. Xu, S. Liu (Tencent),

JVET-AQ0139
43rd Meeting: Geneva, July 2026
AHG9: Historical Information SEI message

J. Pardo, T. Solovyev, E. Alshina (Huawei), X. Xu, S. Liu (Tencent)

JVET-AQ0007
43rd Meeting: Geneva, July 2026
JVET AHG report: Tool assessment (AHG7)

X. Li (chair), L.-F. Chen, Z. Deng, J. Gan, E. François, R. Ishimoto, H.-J. Jhu, J. Lainema, X. Li, J. Pardo, A. Stein, H. Wang (vice-chairs)