Back to Search Document details
4th Meeting: Chengdu, October 2016 2016-10-06 08:38
EE4: Improved affine motion prediction
Authors: Feng Zou Qualcomm Jie Chen Qualcomm Marta Karczewicz Qualcomm Xinwei Li Qualcomm Hsiao-Chiang Chuang Qualcomm W.-J. Chien Qualcomm

Abstract not available in document

Meeting Notes
JVET-D0121 EE4: Improved affine motion prediction [F. Zou, J. Chen, M. Karczewicz, X. Li, H.-C. Chuang, W.-J. Chien (Qualcomm)]

This document presents the results of EE4: improved affine motion prediction. In this test, a 6-parameter affine motion model is used in addition to the existing 4-parameter affine motion model. Simulation results reportedly show that the proposed scheme achieves 0.3%, 0.3%, and 0.3% BD rate reduction, respectively for random access, low delay and low delay P configurations on top of JEM3.0.

Cited:
JVET-D0001 JVET-D0010
ARCHIVE v1 :
JVET-D0121.doc JVET-D0121.xlsm
Decisions
This document presents the results of EE4: improved affine motion prediction. In this test, a 6-parameter affine motion model is used in addition to the existing 4-parameter affine motion model. Simulation results reportedly show that the proposed scheme achieves 0.3%, 0.3%, and 0.3% BD rate reduction, respectively for random access, low delay and low delay P configurations on top of JEM3.0.
Citation