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4th Meeting: Chengdu, October 2016 2016-10-06 09:06
EE1: Cross check report of EE1 Test#2
Authors: T. Tsukuba Sony Ohji Nakagami Sony

Abstract not available in document

Meeting Notes
JVET-D0116 EE1: Cross check report of EE1 Test#2 [T. Tsukuba, O. Nakagami (Sony)]
ARCHIVE v1 :
JVET-D0116.doc JVET-D0116_EE1Test#2(Seq).xlsm
Decisions
JVET-D0116 EE1: Cross check report of EE1 Test#2 [T. Tsukuba, O. Nakagami (Sony)]
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