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4th Meeting: Chengdu, October 2016 2016-10-07 12:53
EE1: Cross-check of EE1 (Improved non-separable secondary transform)
Authors: Kiho Choi Samsung Elena Alshina Samsung Chul Keun Kim Samsung

Abstract not available in document

Meeting Notes
JVET-D0055 EE1: Cross-check of EE1 (Improved non-separable secondary transform) [K. Choi, E. Alshina, C. Kim (Samsung)]
ARCHIVE v3 :
EE1_test01.xlsm EE1_test02.xlsm EE1_test03.xlsm JVET-D0055.doc
Decisions
JVET-D0055 EE1: Cross-check of EE1 (Improved non-separable secondary transform) [K. Choi, E. Alshina, C. Kim (Samsung)]
Citation