JVET-AO0215 AHG4: proposed updates for VVC multi-layer verification test plan [O. Chubach (MediaTek), P. de Lagrange (InterDigital), M. Wien (RWTH)]

This contribution proposes updates to the verification test plan for VVC multilayer coding (JVET-AN2021), merging the first two categories, but keeping focus on quality ladder use case. About 100 test points are proposed to be tested in total, material has been prepared and made available on the Aachen file repository.

It is proposed to merge the first two test categories relating to spatial scalability, keeping quality ladder as the main use case, with the multi-view (stereo) category dropped or deferred for later work, in lack of input (esp. suitable test sequences). Target EL ratio is harmonized to 25%, matching a typical step in quality ladder, and HEVC/SHVC reference is dropped, in favor of:

• Comparing base layer and dual-layer, to assess the contribution of the enhancement layer
• Comparing single-layer and dual-layer, to assess simulcast (or “simulstore”) savings

To address both goals, three variants are tested for each test sequence and rate point: upscaled base layer, dual-layer, and single-layer. How to present results is left for test report discussions.

The following configurations are selected to be tested:

• HD base layer and UHD enhancement layer (2x scaling ratio), using HDR PQ test sequences
• 720p base layer and HD enhancement layer (1.5x scaling ratio), using SDR test sequences
• Both configurations using a 25%/75% EL/BL bitrate allocation

It is still recommended to report objective results using various EL ratios to show how BD-rate (or dual-layer vs single-layer or simulcast) evolves with EL/BL rate allocation. This can be prepared in parallel with visual testing.

Software versions and settings, as well as coding conditions, are left unchanged, except for EL ratio.

Test sequences and single-layer QPs are kept the same (with additional lower rates).

AHG4: Test and training material (0)

This section is kept as a template for future use.

JVET-AO0054, JVET-AO0059, JVET-AO0061, and JVET-AO0248 are related.

AHG5: Conformance test development (0)

This section is kept as a template for future use.

JVET-AO0227 is related.

AHG7: ECM tool assessment (3)

Contributions in this area were discussed during 1520–1650 UTC on XXday X Jan. 2026 (chaired by JRO).