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40th Meeting: Geneva, CH, October 2025 2025-10-03 10:42
EE2-5.6: Reuse of TALF control information
Authors: Yaxian Bai ZTE M. Jia ZTE Weihong Niu ZTE S. Xie ZTE Cheng Huang ZTE
Abstract
This contribution reports simulation results of EE2 Test 5.6. In EE2-5.6, it is proposed to store the Slice-level and CTB-level TALF control information for use in future frames. Compared to ECM-18.0 anchors, the simulation results are summarized as below:
Meeting Notes
JVET-AN0199 EE2-5.6: Reuse of TALF control information [Y. Bai, M. Jia, W. Niu, S. Xie, C. Huang (ZTE)]
Cited:
JVET-AN0300 X JVET-AN0345 X
ARCHIVE :
JVET-AN0199-v2.docx JVET-AN0199-v2.xlsm
Decisions
JVET-AN0199 EE2-5.6: Reuse of TALF control information [Y. Bai, M. Jia, W. Niu, S. Xie, C. Huang (ZTE)]
Citation