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40th Meeting: Geneva, CH, October 2025 2025-10-04 14:17
EE2-5.2: On ALF-CCCM
Authors: Luhang Xu OPPO N. Song OPPO Zhihuang Xie OPPO Fan Wang OPPO Yue Yu OPPO H. Yu OPPO D. Wang OPPO
Abstract
This document reports the test results of EE2-5.2. The EE tests comprise two aspects. In test-5.2a, two non-downsampled filters are introduced in the existing ALF-CCCM. In test-5.2b, an extra partition type is added to the existing ALF-CCCM. The combination of two aspects is tested in test-5.2c. The EE tests are conducted on top of ECM-18.0 with the common test conditions. The test results are summarized as below:
Meeting Notes
JVET-AN0099 EE2-5.2: On ALF-CCCM [L. Xu, N. Song, Z. Xie, F. Wang, Y. Yu, H. Yu, D. Wang (OPPO)]
Cited:
JVET-AN0327 X
ARCHIVE :
EE2-TEST-5.2a.xlsm EE2-TEST-5.2b.xlsm EE2-TEST-5.2c.xlsm JVET-AN0099-v2.docx
Decisions
JVET-AN0099 EE2-5.2: On ALF-CCCM [L. Xu, N. Song, Z. Xie, F. Wang, Y. Yu, H. Yu, D. Wang (OPPO)]
Citation