JVET-AL0245 [AHG7][AHG17] Further consideration of common test condition [T. Ikai, K.-W. Liang (Sharp)] [late]
Was discussed in BoG JVET-AL0337
JVET-AL0245 [AHG7][AHG17] Further consideration of common test condition [T. Ikai, K.-W. Liang (Sharp)] [late]
Was discussed in BoG JVET-AL0337
JVET-AL0245 [AHG7][AHG17] Further consideration of common test condition [T. Ikai, K.-W. Liang (Sharp)] [late]
See also section 4.4.
At the last meeting, JVET-AK0232 proposed the development of constraint test conditions and suggested that a better balance between coding efficiency and encoding time should be considered for CTC as well. This document further explores this notion by analyzing experiment results on ECM-16.1 under various MTT depth settings. It is recommended to configure the encoder setting at the next standard to approximately 2x to 4.5x encoding time compared to VTM.
It is proposed to use MTT depth below for ECM CTC.
--MaxMTTHierarchyDepth=2 --MaxMTTHierarchyDepthISliceL=2
--MaxMTTHierarchyDepthISliceC=2 --MaxMTTHierarchyDepthByTid=221111
Was already presented in JVET on Mar. 28 - to be further discussed in BoG JVET-AL0337.