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36th Meeting: Kemer, TR, November 2024 2024-10-30 16:35
EE2 Test 2.22: A combination test of Test 2.19c and Test 3.10a
Authors: Yifan Wang ByteDance Kai Zhang ByteDance Wenbin Yin ByteDance Zhipin Deng ByteDance N. Zhang ByteDance Lei Zhao ByteDance Mehdi Salehifar ByteDance Li Zhang ByteDance Li Zhang OPPO Zhihuang Xie OPPO Yue Yu OPPO H. Yu OPPO D. Wang OPPO Yang Wang
Abstract
This contribution reports the test results for EE2 Test 2.22, which is a combination test of EE2 Test 2.19c on multi-model for EIP and block-vector guided EIP, and EE2 Test 3.10a on SATD-based reordering for intra coding. On top of ECM-14.0, the simulation results are reported as below:
Meeting Notes
JVET-AJ0277 EE2 Test 2.22: A combination test of Test 2.19c and Test 3.10a [Y. Wang, K. Zhang, W. Yin, Z. Deng, N. Zhang, L. Zhao, M. Salehifar, L. Zhang (Bytedance), L. Zhang, Z. Xie, Y. Yu, H. Yu, D. Wang (OPPO)] [late]
Cited:
JVET-AJ0343 X
ARCHIVE :
JVET-AJ0277.docx JVET-AJ0277.xlsm JVET-AJ0277_source.patch
Decisions
JVET-AJ0277 EE2 Test 2.22: A combination test of Test 2.19c and Test 3.10a [Y. Wang, K. Zhang, W. Yin, Z. Deng, N. Zhang, L. Zhao, M. Salehifar, L. Zhang (Bytedance), L. Zhang, Z. Xie, Y. Yu, H. Yu, D. Wang (OPPO)] [late]
Citation