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36th Meeting: Kemer, TR, November 2024 2024-11-01 12:11
EE2-2.8abgh: Combinations of EE2-2.5, EE2-2.7a/c and EE2-2.1
Authors: Mohsen Abdoli Xiaomi Ramin G. Youvalari Xiaomi F. Plowman Xiaomi Alexandre Tissier Xiaomi Yao-Jen Chang Qualcomm Vadim Seregin Qualcomm Marta Karczewicz Qualcomm Zheming Fan Sharp Takeshi Chujoh Sharp Tomohiro Ikai Sharp yoshitaka kidani KDDI K. Kato KDDI K. Kawamura KDDI Jiaye Fu Peking Univ. Jiaqi Zhang Peking Univ. Siwei Ma Peking Univ.
Abstract
This contribution reports the results of EE2-2.8a EE2-2.8b which are combinations of tests EE2-2.5 and EE2-2.7.
Meeting Notes
JVET-AJ0180 EE2-2.8a/b: Combination of EE2 tests 2.5 and 2.7 [M. Abdoli, R. G. Youvalari, F. Plowman, A. Tissier (Xiaomi), Y.-J. Chang, V. Seregin, M. Karczewicz (Qualcomm), Z. Fan, T. Chujoh, T. Ikai (Sharp), Y. Kidani, K. Kato, K. Kawamura (KDDI), J. Fu, J. Zhang, S. Ma (Peking University)]
Cited:
JVET-AJ0302 X JVET-AJ0358 X
ARCHIVE :
._JVET-AJ0180-Test-a-v2.xlsm ._JVET-AJ0180-Test-b-v2.xlsm ._JVET-AJ0180-Test-g-v2.xlsm ._JVET-AJ0180-Test-h-v2.xlsm ._JVET-AJ0180-v2.docx JVET-AJ0180-Test-a-v2.xlsm JVET-AJ0180-Test-b-v2.xlsm JVET-AJ0180-Test-g-v2.xlsm JVET-AJ0180-Test-h-v2.xlsm JVET-AJ0180-v2.docx
Decisions
JVET-AJ0180 EE2-2.8a/b: Combination of EE2 tests 2.5 and 2.7 [M. Abdoli, R. G. Youvalari, F. Plowman, A. Tissier (Xiaomi), Y.-J. Chang, V. Seregin, M. Karczewicz (Qualcomm), Z. Fan, T. Chujoh, T. Ikai (Sharp), Y. Kidani, K. Kato, K. Kawamura (KDDI), J. Fu, J. Zhang, S. Ma (Peking University)]
Citation