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35th Meeting: Sapporo, JP, July 2024 2024-07-09 09:50
EE2-4.4e: Test 4.4a with reduced number of transform candidates
Authors: Muhammed Coban Qualcomm Marta Karczewicz Qualcomm Vadim Seregin Qualcomm
Abstract
In EE2-4.4 test, multiple LFNST/NSPT transform sets are used for DIMD, TIMD, SGPM, MIP, EIP, and IntraTMP modes. In this contribution the number of transforms in secondary set is configurable and reduced to 1 from 3 with respect to EE2-4.4a.
Cited:
JVET-AI0270 X
ARCHIVE :
JVET-AI0219-TEST-4.4e-v2.xlsm JVET-AI0219-v2.docx
Citation