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32nd Meeting: Hannover, DE, October 2023 2023-10-13 02:58
EE2-2.11: Combination of DIMD/TIMD related tests (EE2-2.3 + EE2-2.5)
Authors: Karam Naser InterDigital Fabrice Le Léannec InterDigital Philippe Bordes InterDigital Antoine ROBERT InterDigital Saverio Blasi Nokia Ivan Zupancic Nokia Jani Lainema Nokia Chuan Zhou vivo Z. Lv vivo
Abstract
This contribution reports the results for EE2 Test 2.11. This test is a combination of tests EE2-2.3 on DIMD Merge/DIMD with filtered template and EE2-2.5 on TIMD with IntraTMP/IBC and IntraCIIP.
Meeting Notes
JVET-AF0229 EE2-2.3: Combination of DIMD/TIMD related tests (EE2-2.3 + EE2-2.5) [K. Naser, F. Le Léannec, P. Bordes, A. Robert (InterDigital), S. Blasi, I. Zupancic, J. Lainema (Nokia), C. Zhou, Z. Lv (Vivo)] [late]
Cited:
JVET-AF0244 X
ARCHIVE :
JVET-AF0229-r1.docx JVET-AF0229-r2.docx template_ecm10.0_vs_Test2-11a.xlsm template_ecm10.0_vs_Test2-11b.xlsm template_ecm10.0_vs_Test2-11c.xlsm template_ecm10.0_vs_Test2-11d.xlsm
Decisions
JVET-AF0229 EE2-2.3: Combination of DIMD/TIMD related tests (EE2-2.3 + EE2-2.5) [K. Naser, F. Le Léannec, P. Bordes, A. Robert (InterDigital), S. Blasi, I. Zupancic, J. Lainema (Nokia), C. Zhou, Z. Lv (Vivo)] [late]
Citation