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32nd Meeting: Hannover, DE, October 2023 2023-10-13 10:33
EE2: Test 2.10 Combination of Test 2.8 and Test 2.9
Authors: Han Huang Qualcomm H. Wang Qualcomm Vadim Seregin Qualcomm Marta Karczewicz Qualcomm Luhang Xu OPPO Yue Yu OPPO H. Yu OPPO Jonathan Gan OPPO D. Wang OPPO
Abstract
This contribution reports the test results of EE2 Test 2.10: Combination of Test 2.8 and Test 2.9. It reports the following result {Y, U, V, EncT, DecT, VmPeak} under CTC:
Meeting Notes
JVET-AF0207 EE2: Test 2.10 Combination of Test 2.8 and Test 2.9 [H. Huang, H. Wang, V. Seregin, M. Karczewicz (Qualcomm), L. Xu, Y. Yu, H. Yu, J. Gan, D. Wang (OPPO)]
Cited:
JVET-AF0220 X
ARCHIVE :
JVET-AF0207.docx TEST_2.10a.xlsm TEST_2.10b.xlsm
Decisions
JVET-AF0207 EE2: Test 2.10 Combination of Test 2.8 and Test 2.9 [H. Huang, H. Wang, V. Seregin, M. Karczewicz (Qualcomm), L. Xu, Y. Yu, H. Yu, J. Gan, D. Wang (OPPO)]
Citation