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32nd Meeting: Hannover, DE, October 2023 2023-10-13 09:51
EE2-2.3: Combination of DIMD related tests (EE2-2.1 + EE2-2.2)
Authors: Saverio Blasi Nokia Ivan Zupancic Nokia Jani Lainema Nokia Chuan Zhou vivo Z. Lv vivo
Abstract
This contribution reports the results for EE2 Test 2.3. This test is a combination of tests EE2-2.1 DIMD Merge and EE2-2.2 DIMD with filtered template.
Meeting Notes
JVET-AF0126 EE2-2.3: Combination of DIMD related tests (EE2-2.1 + EE2-2.2) [S. Blasi, I. Zupancic, J. Lainema (Nokia)]
Cited:
JVET-AF0204 X JVET-AF0276 X
ARCHIVE :
JVET-AF0126-EE2-2.3a-v2.xlsm JVET-AF0126-EE2-2.3b-v2.xlsm JVET-AF0126-EE2-2.3c-v2.xlsm JVET-AF0126-EE2-2.3d-v2.xlsm JVET-AF0126-v2.docx
Decisions
JVET-AF0126 EE2-2.3: Combination of DIMD related tests (EE2-2.1 + EE2-2.2) [S. Blasi, I. Zupancic, J. Lainema (Nokia)]
Citation