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32nd Meeting: Hannover, DE, October 2023 2023-10-13 14:05
EE2-5.1: Dynamic Scaling of Bilateral Filter (BIF)
Authors: Vladislav Shchukin Ericsson P. Wennersten Ericsson J. Ström Ericsson
Abstract
This contribution describes EE2-5.1 which proposes three additional techniques for the Bilateral Filter (BIF):
Meeting Notes
JVET-AF0112 EE2-5.1: Dynamic Scaling of Bilateral Filter (BIF) [V. Shchukin, P. Wennersten, J. Ström (Ericsson)]
Cited:
JVET-AF0203 X
ARCHIVE :
JVET-AF0112-test-5.1a.xlsm JVET-AF0112-test-5.1b.xlsm JVET-AF0112-v2.docx
Decisions
JVET-AF0112 EE2-5.1: Dynamic Scaling of Bilateral Filter (BIF) [V. Shchukin, P. Wennersten, J. Ström (Ericsson)]
Citation