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30th Meeting: Antalya, TR, April 2023 2023-04-22 07:23
EE2-4.4b and 4.4c: Combined Tests for ALF
Authors: Ikram Jumakulyyev Qualcomm Nan Hu Qualcomm Z. Zhi Qualcomm Vadim Seregin Qualcomm Marta Karczewicz Qualcomm Han Huang Qualcomm Wenbin Yin ByteDance Kai Zhang ByteDance Li Zhang ByteDance
Abstract
There are 3 ALF-related EE tests during AC meeting cycle. In test 4.1, the additional fixed-filter for ALF is tested. In test 4.2, the residual based classifier for ALF is tested. In test 4.3, the ALF filter shape with more taps applied to fixed-filter result is tested. In this contribution, the results of ALF-related combined tests 4.4b and 4.4c are reported.
Meeting Notes
JVET-AD0222 EE2-4.4b and 4.4c: Combined Tests for ALF [I. Jumakulyyev, N. Hu, Z. Zhi, V. Seregin, M. Karczewicz, H. Huang (Qualcomm), W. Yin, K. Zhang, L. Zhang (Bytedance)]
Cited:
JVET-AD0341 X
ARCHIVE :
JVET-AD0222.docx JVET-AD0222_EE2_4_4_B.xlsm JVET-AD0222_EE2_4_4_C.xlsm JVET-AD0222_v1.docx TEST_44B_44C.patch
Decisions
JVET-AD0222 EE2-4.4b and 4.4c: Combined Tests for ALF [I. Jumakulyyev, N. Hu, Z. Zhi, V. Seregin, M. Karczewicz, H. Huang (Qualcomm), W. Yin, K. Zhang, L. Zhang (Bytedance)]
Citation