Back to Search Document details
29th Meeting: by teleconference, DE, January 2023 2023-01-19 13:00
EE2 Test 2.1, 2.2, 2.3 and 2.4: Affine DMVR
Authors: Han Huang Qualcomm Yuhuai Zhang Qualcomm Zixiang Zhang Qualcomm CHUN-CHI CHEN Qualcomm Vadim Seregin Qualcomm Marta Karczewicz Qualcomm Jie Chen Alibaba Ru-Ling Liao Alibaba Xinwei Li Alibaba Y. Ye Alibaba
Abstract
This contribution reports the test results related to affine DMVR of EE2 Test 2.1, 2.2, 2.3, and 2.4.
Meeting Notes
JVET-AC0144 EE2 Test 2.1, 2.2, 2.3 and 2.4: Affine DMVR [H. Huang, Y. Zhang, Z. Zhang, C.-C. Chen, V. Seregin, M. Karczewicz (Qualcomm), J. Chen, R.-L. Liao, X. Li, Y. Ye (Alibaba)]
Cited:
JVET-AC0277 X JVET-AC0285 X JVET-AC0287 X
ARCHIVE :
JVET-AC0144-v3.docx JVET-AC0144_Table1.xlsm JVET-AC0144_Table2.xlsm JVET-AC0144_Table3.xlsm JVET-AC0144_Table4.xlsm JVET-AC0144_Table5.xlsm JVET-AC0144_Table6.xlsm JVET-AC0144_Table7.xlsm
Decisions
JVET-AC0144 EE2 Test 2.1, 2.2, 2.3 and 2.4: Affine DMVR [H. Huang, Y. Zhang, Z. Zhang, C.-C. Chen, V. Seregin, M. Karczewicz (Qualcomm), J. Chen, R.-L. Liao, X. Li, Y. Ye (Alibaba)]
Citation