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29th Meeting: by teleconference, DE, January 2023 2023-01-10 04:59
EE2-1.11c: Combination of EE2-1.7, EE2-1.8, EE2-1.9, and EE2-1.10
Authors: Zheming Fan Sharp Yukinobu Yasugi Sharp Tomohiro Ikai Sharp Saverio Blasi Nokia Jani Lainema Nokia T. Dumas InterDigital Kevin Reuzé InterDigital SLA Sharp
Abstract
This contribution reports simulation results of EE2-Test-1.11c. The experimental results reportedly show that the average Luma Bd-rate gain of the EE2-Test-1.11c is 0.31% and 0.16%, under AI and RA respectively.
Meeting Notes
JVET-AC0046 EE2-1.11c: Combination of EE2-1.7, EE2-1.8, EE2-1.9, and EE2-1.10 [Z. Fan, Y. Yasugi, T. Ikai (Sharp), S. Blasi, J. Lainema (Nokia), T. Dumas, K. Reuzé (InterDigital)]
ARCHIVE :
JVET-AC0046.xlsm JVET-AC0046_v3.docx ~$ET-AC0046.docx
Decisions
JVET-AC0046 EE2-1.11c: Combination of EE2-1.7, EE2-1.8, EE2-1.9, and EE2-1.10 [Z. Fan, Y. Yasugi, T. Ikai (Sharp), S. Blasi, J. Lainema (Nokia), T. Dumas, K. Reuzé (InterDigital)]
Citation