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JVET-AL0228
39th Meeting: Daejeon, KR, March 2025 2025-04-03 07:42
EE2-related: NNLF interface in ECM

T. Poirier, F. Galpin, G. Boisson (InterDigital), Y. Li, M. Karczewicz, J. Wang, L. Kerofsky, H. Wang, N. Hu, R. Yu, M. Coban, V. Seregin (Qualcomm), D. Rusanovskyy, K. Panusopone, S. Hong, L. Wang (Nokia)

JVET-AK0047
37th Meeting: Geneva, CH, January 2025 2024-12-12 16:56
AHG7: Complexity and memory footprint assessment of PDP, Neural Network-based Intra Prediction, MTS and LFNST/NSPT, and ALF in ECM-15

G. Boisson, T. Dumas, F. Galpin, S. Puri, K. Naser, C. Bonnineau (InterDigital)

JVET-AJ0190
36th Meeting: Kemer, TR, November 2024 2024-10-31 08:55
Crosscheck of JVET-AJ0138 (EE2-5.1: Adaptive Mantissa Precision for ALF Coefficients)

G. Boisson (InterDigital)

JVET-AI0084
35th Meeting: Sapporo, JP, July 2024 2024-07-11 22:53
EE2-5.2: ALF residuals scaling

P. Bordes, F. Galpin, G. Boisson, F. Urban (InterDigital), N. Hu, V. Seregin, M. Karczewicz (Qualcomm)

JVET-AI0058
35th Meeting: Sapporo, JP, July 2024 2024-07-11 15:16
EE2-5.1: Modifications in ALF syntax

G. Boisson, F. Galpin, P. Bordes (InterDigital)

JVET-AH0163
34th Meeting: Rennes, FR, April 2024 2024-04-20 16:04
AHG12: ALF syntax modification

F. Galpin, G. Boisson, P. Bordes, F. Lefebvre, I. Marzuki (InterDigital)

JVET-AH0170
34th Meeting: Rennes, FR, April 2024 2024-04-19 12:50
Non-EE2: ALF residuals scaling

P. Bordes, F. Galpin, G. Boisson (InterDigital)