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P. Andrivon

Short name: P. Andrivon

pandrivon@ofinno.com Ofinno 53 document(s)
Affiliations
Ofinno 2023-07-11 - 2026-05-01 Xiaomi 2022-01-12 - 2023-01-20 InterDigital 2019-07-03 - 2019-07-12 Technicolor 2019-01-09 - 2019-01-18
Known Emails
Documents
JVET-AP0059
42nd Meeting: Santa Eulària, ES, April 2026 2026-04-24 01:14
EE2-3.2: On the Dead-Zone in Quantization

M. Balcilar, M. Blestel, P. Andrivon (Ofinno)

JVET-AO0139
41st Meeting: by teleconference, CH, January 2026 2026-01-19 22:58
AhG12: On the Dead-Zone in Quantization

M. Balcilar, M. Blestel, P. Andrivon (Ofinno)

JVET-AO0109
41st Meeting: by teleconference, CH, January 2026 2026-01-07 14:14
EE2-3.1 a/b : Unbiased Simple Quantizer

M. Balcilar, M. Blestel, P. Andrivon (Ofinno), M. Le Pendu, F. Le Léannec (InterDigital)

JVET-AN0308
40th Meeting: Geneva, CH, October 2025 2025-10-04 22:50
Crosscheck of JVET-AN0275 (EE2-2.5a: Combination of tests EE2-2.1, EE2-2.3b, and EE2-2.4)

P. Andrivon (Ofinno)

JVET-AN0175
40th Meeting: Geneva, CH, October 2025 2025-10-01 17:47
EE2-related: Unbiased Simple Quantizer (Related to EE2-4.2i)

M. Balcilar, M. Blestel, P. Andrivon (Ofinno)

JVET-AM0299
39th Meeting: Daejeon, KR, June 2025 2025-06-26 09:33
EE2-1.11: a combination of EE2-1.2c and EE2-1.6a

J. Fu, J. Zhang, S. Ma (Peking University), Y. Gao, C. Huang (ZTE), T. Dumas, K. Naser, M. Radosavljević, S. Puri (InterDigital), M.Blestel, P. Andrivon, K. Suverov, N. Zouidi, D. Ruiz Coll, J.-K. Lee (Ofinno), Y. Chang, V. Seregin, M. Karczewicz (Qualcomm Inc.)

JVET-AM0074
39th Meeting: Daejeon, KR, June 2025 2025-06-26 09:32
EE2-1.6: Intra Merge Mode

J. Fu, J. Zhang, S. Ma (Peking University), T. Dumas, K. Naser, M. Radosavljević, S. Puri (InterDigital), M.Blestel, P. Andrivon, K. Suverov, N. Zouidi, D. Ruiz Coll, J.-K. Lee (Ofinno), Y. Chang, V. Seregin, M. Karczewicz (Qualcomm Inc.)

JVET-AM0307
39th Meeting: Daejeon, KR, June 2025 2025-06-25 23:42
EE2-1.12: a combination of EE2-1.2c, EE2-1.6a and EE2-1.3

J. Fu, J. Zhang, S. Ma (Peking University), Y. Gao, C. Huang (ZTE), T. Dumas, K. Naser, M. Radosavljević, S. Puri (InterDigital), M.Blestel, P. Andrivon, K. Suverov, N. Zouidi, D. Ruiz Coll, J.-K. Lee (Ofinno), Y. Chang, V. Seregin, M. Karczewicz (Qualcomm Inc.)

JVET-AL0179
39th Meeting: Daejeon, KR, March 2025 2025-04-01 16:24
Non-EE2: Intra Merge Mode Enhancements

M. Blestel, P. Andrivon (Ofinno), Y. Chang, V. Seregin, M. Karczewicz (Qualcomm Inc.),

JVET-AL0264
39th Meeting: Daejeon, KR, March 2025 2025-03-26 11:18
Crosscheck of JVET-AL0206 (EE2-2.9: Test 2.1 + Test 2.4)

P. Andrivon (Ofinno)

JVET-AK0283
37th Meeting: Geneva, CH, January 2025 2025-01-14 09:56
EE2-1.18: Combination of EE2-1.7 and EE2-1.9

P. Andrivon, M. Blestel, N. Zouidi (Ofinno), L. Zhang, Y. Yu, H. Yu, D. Wang (OPPO)

JVET-AK0056
37th Meeting: Geneva, CH, January 2025 2025-01-14 09:55
EE2-1.9: Weighted OBIC

P. Andrivon, M. Blestel, N. Zouidi (Ofinno)

JVET-AJ0171
36th Meeting: Kemer, TR, November 2024 2024-11-02 14:19
Non-EE2: Weighted OBIC

P. Andrivon, M. Blestel, N. Zouidi (Ofinno)

JVET-AI0265
35th Meeting: Sapporo, JP, July 2024 2024-07-10 17:35
Crosscheck of JVET-AI0136 (EE2-1.1: adaptive dual tree in inter slices)

P. Andrivon (Ofinno)

JVET-AH0128
34th Meeting: Rennes, FR, April 2024 2024-04-16 22:10
EE2-2.5: Combination of EE2-2.2,EE2-2.3, and EE2-2.4

R. G. Youvalari (Xiaomi), S. Blasi (Nokia), M. Blestel (Ofinno), M. Abdoli, I. Zupancic, A. Tissier, P. Andrivon, K. Suverov

JVET-AH0090
34th Meeting: Rennes, FR, April 2024 2024-04-16 17:47
EE2-2.4: DIMD Merge List

M. Blestel, P. Andrivon, K. Suverov

JVET-AG0084
33rd Meeting: by teleconference, CH, January 2024 2024-01-17 18:23
AHG12: DIMD Merge List

M. Blestel, P. Andrivon

JVET-AG0095
33rd Meeting: by teleconference, CH, January 2024 2024-01-16 18:47
EE2-1.22c: Combination of EE2-1.22b and EE2-1.4

P. Andrivon, M. Blestel (Ofinno), C. Zhou, Z. Lv (vivo), K. Naser, F. Le Léannec (InterDigital)

JVET-AG0092
33rd Meeting: by teleconference, CH, January 2024 2024-01-16 09:51
EE2-1.20: TIMD fusion with non-angular predictor

P. Andrivon, M. Blestel (Ofinno)

JVET-AG0094
33rd Meeting: by teleconference, CH, January 2024 2024-01-10 15:59
EE2-1.22b: Combination of EE2-1.20b and EE2-1.21

P. Andrivon, M. Blestel (Ofinno), C. Zhou, Z. Lv (vivo)

JVET-AG0093
33rd Meeting: by teleconference, CH, January 2024 2024-01-10 15:58
EE2-1.22a: Combination of EE2-1.20a and EE2-1.21

P. Andrivon, M. Blestel (Ofinno), C. Zhou, Z. Lv (vivo)

JVET-AF0053
32nd Meeting: Hannover, DE, October 2023 2023-10-13 15:34
EE2-related: Test 2.5a and TIMD fusion improvement

P. Andrivon, M. Blestel (Ofinno), K. Naser, F. Le Léannec, P. Bordes, F. Galpin, A. Robert (InterDigital)

JVET-AF0125
32nd Meeting: Hannover, DE, October 2023 2023-10-06 18:31
Crosscheck of JVET-AF0136 (EE2-2.5a: TIMD with IntraTMP/IBC merge)

P. Andrivon (Ofinno)

JVET-AF0124
32nd Meeting: Hannover, DE, October 2023 2023-10-06 18:31
Crosscheck of JVET-AF0120 (EE2-2.1: DIMD merge)

P. Andrivon (Ofinno)

JVET-AE0166
31st Meeting: Geneva, CH, July 2023 2023-07-12 23:11
AHG12: IntraTMP and IBC search area harmonization

D. Ruiz Coll, B. Chen, P. Andrivon, M. Blestel, (Ofinno)

JVET-AE0137
31st Meeting: Geneva, CH, July 2023 2023-07-12 13:00
Non-EE2: On TIMD fusion

P. Andrivon, M. Blestel (Ofinno)

JVET-AD0203
30th Meeting: Antalya, TR, April 2023 2023-04-22 05:55
EE2-related: Reconstruction-Reordered TMP based on lineal filter model for screen content coding (RRTMP-LFM)

D. Ruiz Coll, O. Patino, P. Andrivon, (Ofinno)

JVET-AD0171
30th Meeting: Antalya, TR, April 2023 2023-04-14 22:37
EE2-3.1: TMP using Reconstruction-Reordered for screen content coding (RR-TMP)

D. Ruiz Coll, O. Patino, P. Andrivon, (Ofinno)

JVET-AC0124
29th Meeting: by teleconference, DE, January 2023 2023-01-12 17:59
Non-EE2: Bi-prediction with block-level only out-of-bound management

F. Le Léannec, M. Blestel, P. Andrivon, M. Radosavljević (Xiaomi)

JVET-AC0276
29th Meeting: by teleconference, DE, January 2023 2023-01-10 18:58
EE2-related: Complexity reduction for Decoder Side Control Point Motion Vector Refinement (test 2.3b)

M. Bestel, F. Le Léannec, P. Andrivon, M. Radosavljević (Xiaomi), H. Huang, Y. Zhang, Z. Zhang, C.-C. Chen, V. Seregim, M. Karczewicz (Qualcomm)

JVET-AC0230
29th Meeting: by teleconference, DE, January 2023 2023-01-09 19:10
Cross-check of JVET-AC0101 (EE2-1.11b: Combination of Test 1.8, Test 1.9 and Test 1.10)

P. Andrivon (Xiaomi)

JVET-AC0232
29th Meeting: by teleconference, DE, January 2023 2023-01-09 19:10
Cross-check of JVET-AC0121 (EE2-related: on GL-CCCM improvement (test 1.12a))

P. Andrivon (Xiaomi)

JVET-AC0229
29th Meeting: by teleconference, DE, January 2023 2023-01-09 19:09
Cross-check of JVET-AC0100 (EE2-1.11a: Combination of Test 1.8 and Test 1.9)

P. Andrivon (Xiaomi)

JVET-AC0228
29th Meeting: by teleconference, DE, January 2023 2023-01-09 19:09
Cross-check of JVET-AC0099 (EE2-1.9: TIMD with directional blending)

P. Andrivon (Xiaomi)

JVET-AC0227
29th Meeting: by teleconference, DE, January 2023 2023-01-09 19:09
Cross-check of JVET-AC0098 (EE2-1.8: Location-dependent DIMD)

P. Andrivon (Xiaomi)

JVET-AC0226
29th Meeting: by teleconference, DE, January 2023 2023-01-09 19:08
Cross-check of JVET-AC0045 (EE2-1.7: Adaptive Reference Region DIMD)

P. Andrivon (Xiaomi)

JVET-AB0216
28th Meeting: Mainz, DE, October 2022 2022-10-19 09:03
Cross-check of JVET-AB0148: "EE2-1.11: Intra prediction fusion"

F. Le Léannec, P. Andrivon (Xiaomi)

JVET-AB0207
28th Meeting: Mainz, DE, October 2022 2022-10-18 15:29
Cross-check of JVET-AB0165 (EE2-1.16: Picture-level geometry transform)

P. Andrivon (Xiaomi)

JVET-AB0144
28th Meeting: Mainz, DE, October 2022 2022-10-14 18:31
EE2 related: Extension of test EE2-3.3

F. Le Leannec, P. Andrivon, M. Radosavljević, M. Blestel (Xiaomi)

JVET-AA0098
27th Meeting: by teleconference, July 2022 2022-07-21 07:21
AHG12: Encoder configuration proposal to reduce worst case encoding time

F. Le Léannec, P. Andrivon, M. Radosavljević (Xiaomi)

JVET-AA0097
27th Meeting: by teleconference, July 2022 2022-07-14 08:35
ECM fix for block-level out-of-bound checking

F. Le Léannec, P. Andrivon, M. Radosavljević (Xiaomi)

JVET-AA0105
27th Meeting: by teleconference, July 2022 2022-07-13 19:14
AHG9: Metadata for display on transparent screens based on ACI SEI messages

E. Thomas, P. Andrivon, F. Le Léannec, M. Radosavljević, M.-L. Champel (Xiaomi)

JVET-AA0096
27th Meeting: by teleconference, July 2022 2022-07-06 18:07
EE2-2.2: Motion compensated picture boundary padding

F. Le Léannec, P. Andrivon, M. Radosavljević (Xiaomi), Z.Zhang, H. Huang, C-C. Chen, Y-J. Chang, Y. Zhang, V. Seregin, M. Coban, M. Karczewicz (Qualcomm)

JVET-Z0130
26th Meeting: by teleconference, April 2022 2022-04-26 01:09
EE2-related: Motion compensation boundary padding

Z. Zhang, H. Huang, C.-C. Chen, Y.-J. Chang, Y. Zhang, V. Seregin, M. Coban, M. Karczewicz (Qualcomm), F. Le Léannec, P. Andrivon, M. Radosavljević, E.Thomas (Xiaomi)

JVET-Z0129
26th Meeting: by teleconference, April 2022 2022-04-21 21:54
AHG9: SEI for transparency information as dedicated layer for transparent screens

E.Thomas, P. Andrivon, F. Le Leannec, M. Radosavljević, M.-L. Champel (Xiaomi)

JVET-Z0189
26th Meeting: by teleconference, April 2022 2022-04-21 09:18
Cross-check of JVET-Z0139 (EE2-2.7 - tests 2.7a/2.7b)

P. Andrivon, F. Le Léannec, M. Radosavljević (Xiaomi)

JVET-Z0188
26th Meeting: by teleconference, April 2022 2022-04-20 23:03
Cross-check of JVET-Z0135 (EE2-Test4.3 - tests 4.3a/4.3b)

P. Andrivon, F. Le Léannec, M. Radosavljević (Xiaomi)

JVET-Y0102
25th Meeting: by teleconference, January 2022 2022-01-17 21:49
On the balance of ECM coding gains between luma and chroma

F. Le Léannec, P. Andrivon, E. Thomas (Xiaomi)

JVET-Y0223
25th Meeting: by teleconference, January 2022 2022-01-17 15:45
On luma/chroma BD-rate balance in ECM: tests combining JVET-Y0102 and JVET-Y0113

Y. Chen, E. Francois, P. Nikitin (InterDigital), F. Le Léannec, P. Andrivon, E. Thomas(Xiaomi)

JVET-Y0104
25th Meeting: by teleconference, January 2022 2022-01-14 12:42
AHG9: Transparency information SEI for transparent screens

E. Thomas, P. Andrivon, F. Le Leannec, M.-L. Champel (Xiaomi)

JVET-O0448
15th Meeting: Gothenburg, SE, July 2019 2019-06-27 14:21
Non-CE2: Inverse LUT carriage for LMCS

P. Andrivon, E. François, C. Chevance, H. Hiron, R. Jullian (InterDigital)

JVET-M0128
13th Meeting: Marrakech, January 2019 2019-01-02 20:41
AHG17: On reference picture management for VVC

Y.-K. Wang, Hendry (Huawei), S. Deshpande (Sharp), M. M. Hannusela (Nokia), G. Ryu, W. Choi (Samsung), X. Wang, Y.-W. Chen (Kawi), L. Zhang (Bytedance), P. Wu, M. Li (ZTE), S.-H. Kim (LG), J. Boyce (Intel), A. M. Tourapis, D. Singer (Apple), F. Edouard, P. Andrivon (Technicolor), Y.-W. Huang, C.-W. Hsu, C.-Y. Chen, T.-D. Chuang, L. Chen (MediaTek), K. Kawamura (KDDI), Y.-C. Sun, J. Lou (Alibaba)

JVET-AF0248
32nd Meeting: Hannover, DE, October 2023
Non-EE2: TIMD fusion optimization

P. Andrivon, M. Blestel (Ofinno), C. Zhou, Zhuoyi Lv (vivo)